Sentris
Electronics Failure Analysis Systems
Lock-in Thermography
Detect and locate low-level heating associated with leakage current and resistive shorts in semiconductors and printed circuit boards.
Lock-in Photometry
Detect photon emissions associated with semiconductor faults such as latch-ups and gate oxide defects.
Micros
Thermal Imaging Microscope Systems
Non-contact temperature measurement of features as small as 2 microns on electronic devices, MEMS, materials, and medical devices.
Our Story
Optotherm designs and manufactures infrared cameras, optical assemblies, image analysis software, and turn-key infrared camera systems.
In 2002, we developed our first thermal imaging system for circuit board failure analysis and have since expanded into semiconductor failure analysis and microscopic thermal analysis.
Our manufacturing facility is located in Warrendale, PA, USA.
2000
- Optotherm incorporated in Pennsylvania, USA
2002
- Thermalyze image analysis software is developed
- Infrasight 160 analog LWIR camera is developed
- EL thermal imaging system for circuit board failure analysis is developed, incorporating the Infrasight 160 analog LWIR camera and Thermalyze
2007
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Infrasight 160 digital LWIR camera is developed
- Micro microscopic thermal imaging system is developed, incorporating the Infrasight 160 digital LWIR camera
- Infrasight 320 LWIR camera is developed
2017
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Infrasight 640 LWIR camera is developed
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Sentris thermal imaging system for device failure analysis is developed, incorporating the Infrasight 640 LWIR camera
2019
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Infrasight 640 9Hz LWIR camera is developed for its reduced restrictions for exported orders
2023
- Infrasight 640-17 LWIR camera is developed
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Univid universal video microscope is developed and incorporated into Sentris
2024
- Infrasight 320-12 LWIR camera is developed
- Micros thermal imaging microscope is developed, incorporating the Infrasight 320-12 LWIR camera
- PEM (Photon Emission) testing tool is developed and incorporated into Thermalyze
- MW640-15 MWIR camera is developed